S. Claramunt, Q. Wu, M. Maestro, M. Porti, M.B. Gonzalez, J. Martin-Martinez, F. Campabadal, M. Nafria, “Non-homogeneous conduction of conductive filaments in Ni/HfO2/Si resistive switching structures observed with CAFM”, Microelectronic Engineering, Vol. 147 pp. 335–338 (2015)
DOI: 10.1016/j.mee.2015.04.112
V. Iglesias, Q. Wu, M. Porti, M. Nafria, G. Bersuker, A. Cordes, “Monitoring defects in III–V materials: A nanoscale CAFM study”, Microelectronic Engineering, Vol. 147 pp, 31–36 (2015)
DOI: 10.1016/j.mee.2015.04.058
Open access http://ddd.uab.cat/record/136896
M. Maestro, J. Martin-Martinez, J. Diaz, A. Crespo-Yepes, M. B. Gonzalez, R. Rodriguez, F. Campabadal, M. Nafria, X. Aymerich, “Analysis of Set and Reset mechanisms in Ni/HfO2-based RRAM with fast ramped voltages”, Microelectronic Engineering, Vol. 147, pp.176–179 (2015)
DOI: 10.1016/j.mee.2015.04.057
Open access http://ddd.uab.cat/record/133466
Q. Wu, M. Porti, A. Bayerl, J. Martin-Martinez, R. Rodriguez, M. Nafria, X. Aymerich, E. Simoen, “Channel-Hot-Carrier degradation of strained MOSFETs: A device level and nanoscale combined approach”, Journal of Vacuum Science and Technology B, Vol 33, 022202, (2015)
C. Couso, M. Porti, J. Martin-Martinez, V. Iglesias, M. Nafria and X. Aymerich, “Conductive-AFM topography and current maps simulator for the study of polycrystalline high-k dielectrics”, Journal of Vacuum Science and Technology B, Vol 33, 031801, (2015)
DOI: 10.1116/1.4915328
Open access http://ddd.uab.cat/record/136766
Fábio Passos, M. Helena Fino, Elisenda Roca Moreno, “Fully Analytical Characterization of the Series Inductance of Tapered Integrated Inductors”, International Journal of Electronics and Telecommunications, vol. 60 (1), pp: 73-77, 2014
Open Acess: http://www.degruyter.com/view/j/eletel.2014.60.issue-1/eletel-2014-0007/eletel-2014-0007.xml
A. Unutulmaz, G. Dundar and F. V. Fernandez, “On the convex formulation of area of slicing floorplans,” Integration, the VLSI Journal, Vol. 50, pp. 74-80, June 2015.
A. Calomarde, E. Amat, F. Moll, J. Vigara, A. Rubio, “SET and noise fault tolerant circuit design techniques: Application to 7 nm FinFET” Microelectronics and Reliability, Volume 54, Issue 4, April 2014, Pages 738–745.
Work published in January 2014 related with the objectives of the project but not supported economically by Maragda.
Open access link: http://hdl.handle.net/2117/23028
Amat, E., Calomarde, A., Moll, F., Canal, R. and Rubio, A.,”Feasibility of embedded DRAM cells on FinFET technology”, IEEE Tr. on Computers, December 2014, DOI:10.1109/TC.2014.2375204
Open Access Link: http://upcommons.upc.edu/e-prints/urlFiles?idDrac=15451919
Pouyan, P., Amat, E. and Rubio, A., “Adaptive Proactive Reconfiguration: A Technique for Process Variability and Aging Aware SRAM Cache Design”, IEEE Tr. on VLSI, October 2014, DOI:http://dx.doi.org/10.1109/TVLSI.2014.2355873.
Open Access link: http://hdl.handle.net/2117/25262