Murat Pak; Francisco V. Fernández; Gunhan Dundar, “Comparison of QMC-Based Yield-Aware Pareto Front Techniques for Multi-Objective Robust Analog Synthesis”, Integration, the VLSI Journal, Aceptado, 2016.
DOI 10.1016/j.vlsi.2016.04.004
2016 Journals
Reliability simulation for analog ICs: Goals, Solutions and Challenges
A. Toro-Frías, P. Martín-Lloret, J. Martín-Martínez, R. Castro-López, E. Roca, R. Rodríguez, M. Nafria, F.V: Fernández, “Reliability simulation for analog ICs: Goals, Solutions and Challenges” Acceptado, 2016.
An automated design methodology of RF circuits by using Pareto-optimal fronts of EM-simulated inductors
R. González-Echevarría, E. Roca, R. Castro-López, F.V: Fernández, J. Sieiro, J.M.López-Villegas, N. Vidal, “An automated design methodology of RF circuits by using Pareto-optimal fronts of EM-simulated inductors, ” IEEE Trans. COMPUTER-AIDED DESIGN of Integrated Circuits and Systems, Aceptado, 2016.
Introduction to the special issue on Radio Frequency Integrated Circuits (RFIC) design techniques
E. Roca y J. Sieiro, “Introduction to the special issue on Radio Frequency Integrated Circuits (RFIC) design techniques”, Integration, the VLSI Journal, vol. 52, pp.183-184, 2016.
Low Power Two-Stage Comb-Decimation Structures for High-Decimation Factors
G. Molina-Salgado, G. Jovanovic-Dolecek and J.M. de la Rosa, “Low Power Two-Stage Comb-Decimation Structures for High-Decimation Factors,” Analog Integrated Circuits and Signal Processing, vol. 88(2), pp.245-254, 2016.
Current-limiting and ultrafast system for the characterization of Resistive Random Access Memories
J. Diaz-Fortuny, M. Maestro, J. Martin-Martinez, A. Crespo-Yepes, R. Rodriguez, M. Nafria and X. Aymerich, “Current-limiting and ultrafast system for the characterization of Resistive Random Access Memories”, Review of Scientific Instruments, Vol. 87, Issue 6, 064705 (2016)
DOI: 10.1063/1.4954973
Open access http://ddd.uab.cat/record/163087
Conductance of Threading Dislocations in InGaAs/Si Stacks by Temperature-CAFM Measurements
C. Couso, V. Iglesias, M. Porti, S. Claramunt, M. Nafria, N. Domingo, G. Bersuker and A. Cordes, “Conductance of Threading Dislocations in InGaAs/Si Stacks by Temperature-CAFM Measurements”, IEEE Electron Device Letters, Vol. 37, Issue: 5, pp. 640-643 (2016)
DOI: 10.1109/LED.2016.2537051
open access http://ddd.uab.cat/record/163088
A new high resolution Random Telegraph Noise (RTN) characterization method for Resistive RAM
M. Maestro, J. Diaz, A. Crespo-Yepes, M. B. Gonzalez, J. Martin-Martinez, R. Rodriguez, M. Nafria, F. Campabadal and X. Aymerich, “A new high resolution Random Telegraph Noise (RTN) characterization method for Resistive RAM”, Solid State Electronics, Vol. 115, pp. 140-145 (2016)
DOI: 10.1016/j.sse.2015.08.010
Open access http://ddd.uab.cat/record/163089