Aplicación de algoritmos evolutivos multiobjectivo al diseño de circuitos integrados: criterios de detención

E Roca, R Castro-Lopez and Francisco V. Fernández, “Aplicación de algoritmos evolutivos multiobjectivo al diseño de circuitos integrados: criterios de detención,” Congreso Español de Metaheurísticas, Algoritmos Evolutivos y Bioinspirados – MAEB, Merida – Almendralejo (España), 4-6 de Febrero de 2015. ISBN: 978-84-697-2150-6

Surrogate modeling and optimization of inductor performances using Kriging functions

F. Passos, R. González-Echevarría, E. Roca, R. Castro-López and F.V. Fernández, “Surrogate modeling and optimization of inductor performances using Kriging functions,” Int. Conf. on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, Istanbul, Turkey, Sept. 2015.

DOI: 10.1109/SMACD.2015.7301675

A fast and accurate reliability simulation method for analog circuits

A. Toro-Frías; R. Castro-López; E. Roca; F. V. Fernández; J. Martin-Martinez; R. Rodriguez; M. Nafria, “A fast and accurate reliability simulation method for analog circuits”, Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2015 International Conference on, pp. 1-4 (2015)

DOI: 10.1109/SMACD.2015.7301704

Threshold voltage and on-current Variability related to interface traps spatial distribution

V. Velayudhan, J.Martin-Martinez, M. Porti, C. Couso, R. Rodriguez,  M. Nafria, X. Aymerich, C. Marquez, F. Gamiz, “Threshold voltage and on-current Variability related to interface traps spatial distribution”, 45th European Solid State Device Research Conference (ESSDERC), pp. 230233 (2015)

DOI: 10.1109/ESSDERC.2015.7324756

New insights on the origin of resistive switching in HfO2 thin films: the role of local mechanical strength

Y. Shi, Y. Ji, F. Hui, M. Nafria, M. Porti, G. Bersuker and M. Lanza, “New insights on the origin of resistive switching in HfO2 thin films: the role of local mechanical strength”, Proceedings of the 22nd International Symposium on the Physical & Failure Analysis of Integrated Circuits (IPFA), pp. 472 – 475 (2015)

DOI: 10.1109/IPFA.2015.7224435.

Random Telegraph noise analysed by using Weighted Time Lag method in Resistive switching devices

M. Maestro, J. Diaz, A. Crespo-Yepes, J. Martin-Martinez , R. Rodriguez, M. B. Gonzalez, F. Campabadal, M. Nafria, X. Aymerich, ”Random Telegraph noise analysed by using Weighted Time Lag method in Resistive switching devices”, Libro de abstracts de la 7th International Conference on Unsolved problems of noise (UPON), pp. 145-146 (2015).