Pouyan, P., Amat, E. and Rubio, A.,”Reliability Challenges in Design of Memristive Memories”, 5th European Workshop on CMOS Variability (VARI), 2014, DOI:http://dx.doi.org/10.1109/VARI.2014.6957074.
Open Access link: http://hdl.handle.net/2117/25636
Pouyan, P., Amat, E. and Rubio, A.,”Reliability Challenges in Design of Memristive Memories”, 5th European Workshop on CMOS Variability (VARI), 2014, DOI:http://dx.doi.org/10.1109/VARI.2014.6957074.
Open Access link: http://hdl.handle.net/2117/25636