F. Passos, E. Roca, R. Castro-López, F. V. Fernández, Y. Ye, D. Spina, T. Dhaene, “Frequency-Dependent Parameterized Macromodeling of Integrated Inductors”, International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Lisboa (Portugal), 27-30 Junio, 2016. ISBN: 978-1-5090-0489-8
2016 Conferences
SIDe-O: A Toolbox for Surrogate Inductor Design and Optimization
F. Passos, E. Roca, R. Castro-López, F. V. Fernández, “SIDe-O: A Toolbox for Surrogate Inductor Design and Optimization”, International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), Lisboa (Portugal), 27-30 Junio, 2016. ISBN: 978-1-5090-0489-8
High-Level Optimization of Sigma-Delta Modulators Using Multi-Objective Evolutionary Algorithms
Manuel Velasco-Jiménez, Rafael Castro-López and José M. de la Rosa, “High-Level Optimization of Sigma-Delta Modulators Using Multi-Objective Evolutionary Algorithms”, IEEE International Symposium on Circuits and Systems (ISCAS), Montreal, Canada, 23/05/16.
Design of a Power-Efficient Widely-Programmable Gm-LC Band-Pass Sigma-Delta Modulator for SDR
José M. de la Rosa, “Design of a Power-Efficient Widely-Programmable Gm-LC Band-Pass Sigma-Delta Modulator for SDR”, IEEE International Symposium on Circuits and Systems (ISCAS), Montreal, Canada, 23/05/16.
CAFM analysis of the Temperature Dependence of Random Telegraph Noise in SiON gate dielectrics
Q. Wu, J. Martín-Martínez, M. Porti, R. Rodríguez, M. Nafría, X. Aymerich, “CAFM analysis of the Temperature Dependence of Random Telegraph Noise in SiON gate dielectrics”, 19th Workshop on Dielectrics in Microelectronics (WODIM), (2016)
Intra-device statistical parameters in variability-aware modelling of resistive switching devices
A. Crespo-Yepes, J. Martin-Martinez, I. Rama, M. Maestro, R. Rodriguez, M. Nafria, X. Aymerich, M. B. Gonzalez, F. Campabadal, “Intra-device statistical parameters in variability-aware modelling of resistive switching devices”, 2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), pp. 84-87 (2016)
DOI: 10.1109/ULIS.2016.7440058