A new high resolution Random Telegraph Noise (RTN) characterization method for Resistive RAM

M. Maestro, J. Diaz, A. Crespo-Yepes, M. B. Gonzalez, J. Martin-Martinez, R. Rodriguez, M. Nafria, F. Campabadal and X. Aymerich, “A new high resolution Random Telegraph Noise (RTN) characterization method for Resistive RAM”, Solid State Electronics, Vol. 115, pp. 140-145 (2016)

DOI: 10.1016/j.sse.2015.08.010
Open access http://ddd.uab.cat/record/163089