Conductance of Threading Dislocations in InGaAs/Si Stacks by Temperature-CAFM Measurements

C. Couso, V. Iglesias, M. Porti, S. Claramunt, M. Nafria, N. Domingo, G. Bersuker and A. Cordes, “Conductance of Threading Dislocations in InGaAs/Si Stacks by Temperature-CAFM Measurements”, IEEE Electron Device Letters,  Vol. 37,  Issue: 5, pp. 640-643 (2016)

DOI: 10.1109/LED.2016.2537051
open access http://ddd.uab.cat/record/163088