Connecting the physical and application level towards grasping aging effects

H. Amrouch, J. Martin-Martinez, V. M. van Santen, M. Moras, R. Rodriguez, M. Nafria, and X. Aymerich, “Connecting the physical and application level towards grasping aging effects”, Proceedings of the IEEE International Reliability Physics Symposium (IRPS),  pp. 3D.1.1 – 3D.1.8 (2015)

DOI: 10.1109/IRPS.2015.7112711.