CAFM analysis of the Temperature Dependence of Random Telegraph Noise in SiON gate dielectrics

Q. Wu, J. Martín-Martínez, M. Porti, R. Rodríguez, M. Nafría, X. Aymerich, “CAFM analysis of the Temperature Dependence of Random Telegraph Noise in SiON gate dielectrics”, 19th Workshop on Dielectrics in Microelectronics (WODIM), (2016)