J. Martin-Martinez, J. Díaz, R. Rodriguez, M. Nafria, X. Aymerich, E. Roca, F.V. Fernández and A. Rubio, “Characterization of random telegraph noise and its impact on reliability of SRAM sense amplifiers”, Proceedings of the 5th European Workshop on CMOS Variability (VARI), Palma de Mallorca, España, 29 septiembre-1 octubre 2014.
Open Acess: http://upcommons.upc.edu/handle/2117/27058