1. Timing-Optimized Hardware Implementation to Accelerate Polynomial Multiplication in the NTRU Algorithm

E. Camacho-Ruiz, S. Sánchez-Solano, P. Brox and M.C. Martínez-Rodríguez, ACM Journal on Emerging Technologies in Computing Systems, vol. 17, no. 3, article 35, 2021.

DOI: 10.1145/3445979


2. Improving the reliability of SRAM-based PUFs under varying operation conditions and aging degradation

P Saraza-Canflanca, H Carrasco-Lopez, A Santana-Andreo, P. Brox, R Castro-Lopez, E. Roca, F. V. Fernandez, Microelectronics Reliability, vol. 118, 114049, 2021.

DOI: 10.1016/j.microrel.2021.114049.


3. An Efficient Transformer Modeling Approach for mm-Wave Circuit Design

Fabio Passos, Elisenda Roca, Javier Sieiro, Rafael Castro-Lopez, Francisco V. Fernandez, AEU - International Journal of Electronics and Communications, vol. 128, 153496, 2021.

DOI: 10.1016/j.aeue.2020.153496.


4. Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions

J. Diaz-Fortuny, P. Saraza-Canflanca, R. Rodriguez, J.Martin-Martinez, R. Castro-Lopez, E. Roca, F. V. Fernandez, M. Nafria, Solid-State Electronics, vol. 185, 108037, 2021.

DOI: 10.1016/j.sse.2021.108037.


5. Statistical Characterization of Time-Dependent Variability Defects Using the Maximum Current Fluctuation

P Saraza-Canflanca, J Martin-Martinez, R Castro-Lopez, E Roca, R Rodriguez, FV Fernandez, M Nafria, IEEE Transactions on Electron Devices,  2021.

DOI: 10.1109/TED.2021.3086448.


6. Insights into the Dynamics of Coupled VO2 Oscillators for ONNs

Juan Núñez, José M. Quintana, María J. Avedillo, Manuel Jiménez, Aida Todri-Sanial, Elisabetta Corti, Siegfried Karg, Bernabé Linares-Barranco, IEEE Transactions on Circuits and Systems II: Express Briefs,  2021.

DOI: 10.1109/TCSII.2021.3085133.


7. Oscillatory Neural Networks Using VO2 Based Phase Encoded Logic

Juan Núñez, María J. Avedillo, Manuel Jiménez, José M. Quintana, Aida Todri-Sanial, Elisabetta Corti, Siegfried Karg, Bernabé Linares-Barranco, Frontiers in Neuroscience, vol. 15, pp. 442  2021.

DOI: 10.3389/fnins.2021.655823.


8. Unified RTN and BTI statistical compact modeling from a defect-centric perspective

G. Pedreira, J. Martin-Martinez, P. Saraza-Canflanca, R. Castro-Lopez, R. Rodriguez, E. Roca, F.V. Fernandez, M. NafriaSolid-State Electronics, vol. 185, 108112, 2021.

DOI: 10.1016/j.sse.2021.108112.


International Conferences

1. Circuit reliability prediction: challenges and solutions for the device time-dependent variability characterization roadblock

M Nafria, J Diaz-Fortuny, P Saraza-Canflanca, J Martin-Martinez, E Roca, R Castro-Lopez, R Rodriguez, P Martin-Lloret, A Toro-Frias, D Mateo, E Barajas, X Aragones, FV Fernandez, Proceedings IEEE Latin America Electron Devices Conference (LAEDC), 2021.


2. A complete smart approach for the RTN characterization and modelling of scaled MOSFETs

J Martin-Martinez, G. Pedreira, P Saraza-Canflanca, J Diaz-Fortuny, R Castro-Lopez, R Rodriguez, E Roca, X Aymerich, FV Fernandez, M Nafria, Proceedings  Spanish Conference on Electron Devices (CDE), 2021.