Group of Design and Test of AMS and RF Integrated Circuits and Systems
The group of Design and Test of AMS and RF Integrated Circuits and Systems carries out activities related to the design and test of analog, mixed-signal and radio-frequency integrated circuits (AMS-RF ICs), targeting a broad application range. Recent activity has focused on following sub-lines:
- Development of design techniques and methodologies, mainly in advanced CMOS technologies, for analogue mixed-signal and radiofrequency circuits
- Development of efficient characterization and test techniques for integrated mixed-signal and RF circuits.
- Design of analog and mixed-signal circuits and systems for critical aerospace applications, with emphasis on embedded aerospace applications.
- Development of alternative novel bio-instrumentation circuits and systems (Lab-on-Chip).
- Development, analysis and design of circuits using emerging devces and non-conventional logic models.
Objectives of the group
- Design techniques and methodologies for analog and mixed-signal circuits in advanced CMOS technologies, with special emphasis on Analog-to Digital Converters (ADCs) and IPs for demanding wireless applications.
- Development of background digital calibration techniques for ADCs to increase its performance and robustness against technological and environment variability.
- Design of high resolution low-power mixed-signal CMOS IPs for space applications.
- Design methodology for RF front-end optimization considering power and noise trade-offs.
- Low-cost and efficient characterization techniques for AMS and RF circuits, and performance-based test strategies for on-chip testing implementation.
- Alternative Design-for-tests (DfT) and Built-in-self-test (BIST) schemes for AMS/RF circuits.
- Development of alternative bio-instrumentation circuits and systems to improve the quality of acquired biosignals, useful in biomedical assays and clinical diagnosis.
- Design of bio-instrumentation systems to reduce the cost of biomedical assays
- Development and evaluation of circuits using steep-slope devices for applications with severe constraints on power or energy like IoT.